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CT45-HV 3KV RACK

Testing

CT45-HV 3KV RACK

Developed for high voltage testing, the CT45-HV 3kV Rack device is a relay matrix rack with an upgraded CT45 controller designed to incorporate all CS WIN nx® functionalities.

The combination of the CT45-HV 3kV Rack device with the CS WIN nx® testing software enables the integration of both low and high voltage technologies in a single application, providing full flexibility. The CT45-HV 3kV Rack device has a management capacity of up to 144 test points and can be combined with the LV test point card bus, making it more versatile. The system is capable of performing a wide range of measurements, including dielectric withstand, insulation test, 4-wire measurement, short-circuit, connection, component, leak, fiber optic attenuation, color detection, and B+ detection. In summary, the combination of the CT45-HV 3kV Rack device and CS WIN nx® testing software provides full flexibility for integrating both low and high voltage technologies in a single application.

CT45-HV 3KV RACKSPECIFICATIONS
Specification nameSpecification value
Dimensions/height134 mm
Width427 mm
Dimensions/depth376 mm
Weight2.9 kg
Total power max.250 W
Ambient temperature, operation min.10 °C
Ambient temperature, operation max.40 °C
Ambient temperature, storage min.-10 °C
Ambient temperature, storage max.60 °C
Air humidity non-condensing min.40 %
Air humidity non-condensing max.75 %
Protection classIP 20
Test voltage (AC) min.22.8 V
Test voltage (DC) min.20 mV
Test voltage (DC) max.15 V
Test voltage (AC) max.25.2 V
Test current (DC) max.1 A
Test points, internal max.8
Test points, external max.136
Continuity test via threshold identification min.20 Ω
Continuity test via threshold identification max.10 kΩ
Tolerance continuity test, +/- max.2 %
Short-circuit test via threshold identification min.10 kΩ
Short-circuit test via threshold identification max.1 MΩ
Accuracy short-circuit test, +/- max.5 %
Switch test min.20 Ω
Switch test max.10 kΩ
Tolerance switch test, +/-2 %
Resistance measurement min.5 Ω
Resistance measurement max.1 MΩ
Tolerance resistance measurement, +/- max.1 %
Capacitance measurement min.10 nF
Capacitance measurement max.100 nF
Tolerance capacitance measurement, +/- max.5 %
Diode test max.11 V
Leak test, depending on start pressure and duration: - Standard: Overpressure / Negative pressureja
Leak test, depending on start pressure and duration: -Qualified test: overpressure / negative pressureja
Fiber optic, attenuation, depending on lengthja
Color recognitionja
B+ recognitionja
High voltage test max.4000 V
High voltage test 2 max.3000 V
DIO voltage min.12 V
DIO voltage max.24 V
Digital outputs8
Output current (each DO) min.0.35 A
Output current (each DO) max.0.5 A
Digital inputs8
Test software: CS WIN nx ®ja
CT Test software, optional TASnein
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